Burn-in Test

 

Burn-in is an electrical stress test that employs voltage and temperature to accelerate the electrical' ailure of a device. It simulates the operating life of the device, since the electrical stimulation applied during burn-in may mirror the worst-case bias that the device will be subjected to in the course of its useable life.

 

It can also be used as a reliability monitor or as a production screen to weed out potential infant mortalities from the lot. Industrial players value fast, accurate test systems because factors such as speed, software development, utilization, field maintenance and overall costs contribute to the overall costs of the procedure.